13 citations
- Siemens (Germany)DE4 papers
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- Deutsches Zentrum für Luft- und Raumfahrt e. V. (DLR)DE1 paper
- École Normale Supérieure de LyonFR1 paper
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cs.CV2026★ 1 cited
SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis
Jing Jie Tan, Rupert Schreiner, Matthias Hausladen +8
Accurate characterization of silicon microstructures is essential for advancing microscale fabrication, quality control, and device performance. Traditional analysis using Scanning…
cs.CV2021★ 13 cited
Learning Visual Representations with Optimum-Path Forest and its Applications to Barrett's Esophagus and Adenocarcinoma Diagnosis
Luis A. de Souza, Luis C. S. Afonso, Alanna Ebigbo +5
In this work, we introduce the unsupervised Optimum-Path Forest (OPF) classifier for learning visual dictionaries in the context of Barrett's esophagus (BE) and automatic adenocarc…