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20102023
most citedAb-initio study of the bandgap engineering of Al(1-x)Ga(x)N for optoelectronic applications

210 citations

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physics.ins-det2017

Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets

Johar Zeb, Shad Ali, Muhammad Haneef +2

This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materi…