Publications (26)
Microscopic study of interlayer magnetic coupling across the interface in antiferromagnetic bilayers
Sandip Halder, Sudip Mandal, Kalpataru Pradhan
The enhancement of Neel temperature () of low- antiferromagnets in antiferromagnetic bilayers AF1/AF2, where the of AF1 is larger than AF2 (for example enhancemen…
A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation
Enrique Dehaerne, Bappaditya Dey, Sandip Halder +1
Innovative Electronic Design Automation (EDA) solutions are important to meet the design requirements for increasingly complex electronic devices. Verilog, a hardware description l…
Optimizing YOLOv7 for Semiconductor Defect Detection
Enrique Dehaerne, Bappaditya Dey, Sandip Halder +1
The field of object detection using Deep Learning (DL) is constantly evolving with many new techniques and models being proposed. YOLOv7 is a state-of-the-art object detector based…
SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection
Vic De Ridder, Bappaditya Dey, Enrique Dehaerne +3
Continual shrinking of pattern dimensions in the semiconductor domain is making it increasingly difficult to inspect defects due to factors such as the presence of stochastic noise…
Layer Resolved Magnetotransport Properties in Antiferromagnetic/Paramagnetic Superlattices
Sandip Halder, Sourav Chakraborty, Kalpataru Pradhan
We investigate the layer resolved magnetotransport properties of the antiferromagnetic/paramagnetic superlattices based on one band half-filled Hubbard model in three dimensions. I…
SEMI-PointRend: Improved Semiconductor Wafer Defect Classification and Segmentation as Rendering
MinJin Hwang, Bappaditya Dey, Enrique Dehaerne +2
In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rend…