papers

Publications (23)

cond-mat.mtrl-sci2023

Direct assessment of the proton affinity of individual surface hydroxyls with non-contact atomic force microscopy

Margareta Wagner, Bernd Meyer, Martin Setvin +2

The state of protonation/deprotonation of surfaces has far-ranging implications in all areas of chemistry: from acid-base catalysis and the electro- and photocatalytic splittin…

cond-mat.mtrl-sci2026

Photoexcited Hole States at the SrTiO3(001) Surface Imaged with Noncontact AFM

Igor Sokolovic, Florian Ellinger, Aji Alexander +8

The behaviour of excess charges in ionic lattices, such as the formation of polarons and charge trapping at defect sites, influences the physical and chemical properties of materia…

cond-mat.mtrl-sci2018

Sexiphenyl on Cu(100): nc-AFM tip functionalization and identification

Margareta Wagner, Martin Setvin, Michael Schmid +1

The contrast obtained in scanning tunneling microscopy (STM) and atomic force microscopy (AFM) images is determined by the tip termination and symmetry. Functionalizing the tip wit…

cond-mat.mtrl-sci2023

Real-space investigation of polarons in hematite Fe2O3

Jesus Redondo, Michele Reticcioli, Vit Gabriel +17

In polarizable materials, electronic charge carriers interact with the surrounding ions, leading to quasiparticle behaviour. The resulting polarons play a central role in many mate…

cond-mat.mtrl-sci2023

Hematite in top and side view: resolving long-standing controversies about its surface structure

Jesús Redondo, Jan Michalička, Giada Franceschi +13

Hematite is the most-investigated iron oxide model system in photo and electrocatalytic research. The rich chemistry of Fe and O allows for many bulk and sur…

cond-mat.mtrl-sci2019

Defect chemistry of Eu dopants in NaI scintillators studied by atomically resolved force microscopy

Manuel Ulreich, Lynn A. Boatner, Igor Sokolovic +6

Activator impurities and their distribution in the host lattice play a key role in scintillation phenomena. Here a combination of cross-sectional noncontact atomic force microscopy…