Publications (4)
New categories of Safe Faults in a processor-based Embedded System
C. C. Gursoy, M. Jenihhin, A. S. Oyeniran +4
The identification of safe faults (i.e., faults which are guaranteed not to produce any failure) in an electronic system is a crucial step when analyzing its dependability and its…
The CMS Phase-2 Fast Beam Condition Monitor prototype test with beam
G. Auzinger, H. Bakhshiansohi, A. E. Dabrowski +40
The Fast Beam Condition Monitor (FBCM) is a standalone luminometer for the High Luminosity LHC (HL-LHC) program of the CMS Experiment at CERN. The detector is under development and…
The CMS Fast Beam Condition Monitor for HL-LHC
G. Auzinger, H. Bakhshiansohi, A. Dabrowski +28
The high-luminosity upgrade of the LHC brings unprecedented requirements for real-time and precision bunch-by-bunch online luminosity measurement and beam-induced background monito…
Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
K. Shibin, G. Auzinger, H. Bakhshiansohi +24
The high-luminosity upgrade of the LHC (HL-LHC) brings unprecedented requirements for precision bunch-by-bunch luminosity measurement and beam-induced background monitoring in real…