Publications (16)
Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers
Leora E. Dresselhaus-Marais, Bernard Kozioziemski, Theodor S. Holstad +40
The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural…
Simulating dark-field x-ray microscopy images with wave front propagation techniques
Mads Carlsen, Carsten Detlefs, Can Yildirim +2
Dark-Field X-ray Microscopy (DFXM) is a diffraction-based synchrotron imaging techique capable of imaging defects in the bulk of extended crystalline samples. We present numerical…
Spatially resolved mapping of coherent twin relationships in DFXM measurements
Mads Carlsen, Marion Hoefling, Carsten Detlefs +1
With dark firld x-ray microscopy, it is possible to measure reciprocal space manps of localized volumes embedded deeply in a large sample. Ferroelastic materials contains elastic t…
Real-time imaging of acoustic waves in bulk materials with X-ray microscopy
Theodor S. Holstad, Leora E. Dresselhaus-Marais, Trygve Magnus Ræder +10
Materials modelling and processing require experiments to visualize and quantify how external excitations drive the evolution of deep subsurface structure and defects that determin…
A finite difference scheme for integrating the Takagi-Taupin equations on an arbitrary orthogonal grid
Mads Carlsen, Hugh Simons
Calculating dynamical diffraction patterns for X-ray topography and similar x-ray scattering-imaging techniques require the numerical integration of the Takagi-Taupin equations. Th…
Unveiling the interaction mechanisms of electron and X-ray radiation with halide perovskite semiconductors using scanning nano-probe diffraction
Jordi Ferrer Orri, Tiarnan A. S. Doherty, Duncan Johnstone +5
The interaction of high-energy electrons and X-ray photons with soft semiconductors such as halide perovskites is essential for the characterisation and understanding of these opto…