Publications (5)
AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach
Thomas Benjamin Britton, Vivian Tong, Jim Hickey +2
Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily…
Calibration and data analysis routines for nanoindentation with spherical tips
Diana Avadanii, Anna Kareer, Lars Hansen +1
Instrumented spherical nanoindentation with a continuous stiffness measurement has gained increased popularity in material science studies in brittle and ductile materials alike. T…
Decoupling Strain-Rate Sensitivity and Deformation Length Scale Effects in Neutron-Irradiated Tungsten: A Coupled Nano-Indentation, HR-EBSD and Crystal Plasticity Study
Prashil S. Joshi, Bethany Jim, Chris Hardie +3
Plastic deformation during strain-rate-controlled spherical nanoindentation is governed by the coupled evolution of constitutive strain-rate sensitivity and deformation length scal…
Scratching the surface: Elastic rotations beneath nanoscratch and nanoindentation tests
Anna Kareer, Edmund Tarleton, Christopher Hardie +2
In this paper, we investigate the residual deformation field in the vicinity of nano-scratch tests using two orientations of a Berkovich tip on an (001) Cu single crystal. We compa…
Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach
Alexander Foden, David Collins, Angus Wilkinson +1
Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction pattern…