Study of Silicon Photomultiplier Performance at Different Temperatures
arXiv:2005.10665 · doi:10.1016/j.nima.2021.165162
Abstract
Decreasing the operation temperature of a Silicon Photo-Multiplier (SiPM) leads to a drop in its dark noise. Some experiments consider cold temperatures as an option for low noise applications of SiPM. One of those is the TAO detector, which requires operation at C. A significant dependence of the Photon Detection Efficiency (PDE) of a SiPM on different temperatures was reported with a drastic drop around this temperature. In this paper, we present studies of performance for two samples of SiPMs from Hamamatsu and AdvanSID(FBK) companies in a broad temperature range. No significant difference for the PDE was observed.
Keywords: Silicon Photomultiplier - SiPM, Photon Detection Efficiency - PDE, Dark Count Rate - DCR, PDE temperature dependence